CHEN, Adrian; WIDIYANTO, Eka Puji. Analysis of YOLO26 Model Performance with Transfer Learning in Detecting Coffee Bean Defects. Brilliance: Research of Artificial Intelligence, [S. l.], v. 6, n. 2, p. 243–252, 2026. DOI: 10.47709/brilliance.v6i2.8715. Disponível em: https://itscience-indexing.com/jurnal/index.php/brilliance/article/view/8715. Acesso em: 13 jun. 2026.